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| 12.05.2022 10:00 |
iSYSTEM Supports AUTOSAR ARTI and the ASAM ARTI MDF4 |
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Schwabhausen, Germany, May 12, 2022 – For many years, iSYSTEM has been supporting the Best Trace Format (BTF) standard in its software analyzer winIDEA. Such a format is important to both, visualize data in an analysis tool and to export that data in a standardized form for further analysis in additional tools. As of now, the iSYSTEM tool also supports AUTOSAR Run-Time Interface (ARTI) and the popular storage-efficient binary trace format ASAM ARTI MDF (Measurement Data Format). |
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| 22.03.2022 14:30 |
iSYSTEM’s Tools support Infineon AURIX™ TC4x |
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Schwabhausen, Germany, March 22, 2022 – When Infineon announced the availability of first samples of their next-generation AURIX™ TC4x earlier this year, iSYSTEM was immediately ready to offer support: The company’s proven IDE winIDEA and the BlueBox on-chip analyzers support the new AURIX™ family with its advanced debug and trace capabilities for speeding up the development of sophisticated functions for electric cars and other future mobility solutions. |
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| 17.02.2022 14:00 |
iSYSTEM’s BlueBox supports RISC-V |
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Schwabhausen, Germany, February 17, 2022 – iSYSTEM makes the high performance of its BlueBox series available for RISC-V developers: The iC5700 BlueBox and iC5000 BlueBox support debugging and tracing for complex applications based on the increasingly popular open standard instruction set architecture. The BlueBox unit comes with the integrated development and test environment winIDEA/testIDEA and helps RISC-V developers to efficiently execute their debug and testing cycles for industrial, consumer, IoT, and automotive applications. |
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| 25.01.2022 10:00 |
Timing Measurement for all NXP S32K3 devices with a new iSYSTEM Emulation Adapter |
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Schwabhausen, Germany, January 25, 2022 – Tracing is a powerful technique for debugging and optimizing embedded applications. However, not all MCUs provide the necessary additional pins (trace port) – but thanks to the iSYSTEM Emulation Adapters embedded developers can retrieve trace data e.g. for timing measurement from their target device anyway. iSYSTEM’s latest addition to their portfolio is the NXP S32K344 Emulation Adapter which helps accelerating software tests and speeding up the product’s time-to-market. This Emulation Adapter is populated with an NXP S32K344 “umbrella” device offering extra pins to enable trace for all S32K3 derivatives. |
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| 14.12.2021 10:00 |
Risk-free debugging with iSYSTEM Galvanic Isolation Adapters |
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Schwabhausen, Germany, December 14, 2021 – Developing and testing embedded systems means working with a live target system which is under the power. For embedded designs which feature high-voltage circuits like Automotive battery management systems, iSYSTEM offers a series of Galvanic Isolation Adapters which prevent developers from personal injury and equipment from electrical damage without affecting signal integrity. |
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| 17.11.2021 10:00 |
Free iSYSTEM Profiler Packages simplify AUTOSAR development |
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Schwabhausen, Germany, November 17, 2021 – iSYSTEM introduces a series of free Profiler Packages for different AUTOSAR embedded real-time operating systems. Automotive software developers can utilize the packages – which consist of configuration examples, scripts and pre-recorded sample traces – to evaluate the timing analysis capabilities of the iSYSTEM winIDEA Analyzer and thus to explore ways to optimize their application codes. |
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