IAR Systems beefs up debugging offering with new probe for full instruction trace in real time
Uppsala, Sweden - November 18, 2014 - IAR Systems® proudly presents I-jet Trace™: a powerful probe providing extensive debugging and trace functionality. I-jet Trace delivers large trace memory capacities and high-speed communication via USB 3. It supports all ARM® Cortex®-M cores, including the new ARM Cortex-M7 core, with Embedded Trace Macrocell (ETM) capabilities. Tracing every single executed instruction, ETM provides developers with unmatched insight into the microcontroller’s activities and enables them to find those million dollar bugs that are difficult or even impossible to find any other way.

I-jet Trace offers a memory capacity of 32 Msamples and is designed to take full advantage of the speed and current delivery of the SuperSpeed USB 3 communication port, enabling truly high-speed debugging. The probe allows real-time trace clocking at up to 150 MHz and Serial Wire Output (SWO) using Manchester and UART, clocking at up to 200 Mbps. The trace data is collected by the C-SPY® Debugger in IAR Embedded Workbench® and can be visualized and analyzed in various windows.

I-jet Trace is a new valuable player in IAR Systems’ lineup of in-circuit debugging probes. The product portfolio covers different needs from initial to more advanced development and is targeted for simplified, seamless and more flexible development workflows. All products are completely integrated with IAR Embedded Workbench and are delivered with access to IAR Systems’ renowned global support and product maintenance.

“With I-jet Trace, we equip developers with top-notch technology,” comments Mats Ullström, Product Director, IAR Systems. “In short, I-jet Trace has all the features of our easy-to-use I-jet, but with enhanced performance and full ETM trace capabilities. The embedded industry craves advanced debugging functionality available at more developers’ desks and we are responding to that need.”

The complete debugging solution provided by I-jet Trace and C-SPY also includes Power Debugging. This technology provides developers with information about how the software implementation of an embedded system affects the system’s power consumption. I-jet Trace can be used together with IAR Systems’ probe I-scope™, which lets developers know the power consumed by individual modules, detect if design flaws in the code are causing unnecessary power consumption and possibly extend battery lifetime.

I-jet Trace supports JTAG and Serial Wire Debug (SWD) clocking at up to 100MHz. USB 3.0 and USB 2.0 are supported. The probe can supply the target board with power entirely powered by USB 3, but can optionally also be used with external power. More information is available at www.iar.com/ijettrace.
About IAR Systems

IAR Systems provides developers of embedded systems with world-leading software tools for developing competitive products based on 8-, 16-, and 32-bit processors. Established in Sweden in 1983, the company has over 46 000 customers globally, mainly in the areas of industrial automation, medical devices, consumer electronics, telecommunication, and automotive products. IAR Systems has an extensive network of partners and cooperates with the world’s leading semiconductor vendors. IAR Systems Group AB is listed on NASDAQ OMX Stockholm. For more information, please visit www.iar.com.

Please follow IAR Systems on Twitter www.twitter.com/iarsystems and Facebook www.facebook.com/iarsystems.

Editor's Note: IAR Systems, IAR Embedded Workbench, C-SPY, C-RUN, visualSTATE, Focus on Your Code, IAR KickStart Kit, IAR Experiment!, I-jet, I-scope, IAR Academy, IAR, and the logotype of IAR Systems are trademarks or registered trademarks owned by IAR Systems AB. All other products names are trademarks of their respective owners.
 
 
 
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Date: 18.11.2014 09:30
Number: PR 22/14
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I-jet Trace - IAR Systems beefs up debugging offering with new probe for full instruction trace in real time
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IAR Systems Contact:
Stefan Skarin, CEO, IAR Systems
Tel: +46 18 16 78 00    
E-mail: stefan.skarin@iar.com

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